Standard Products
HTDGS Dynamic gate bias burn-in test equipment

HTDGS (The high-temperature dynamic gate bias test system) is mainly used for the power semicon-ductor dynamic gate bias burn-in test, and the equipment can apply a specified gate bias pressure (Voltage can be configured according to customer requirement), test software can setup the measure-ment parameters and monitor parameters, collect and record all real-time test parameters, Such as temperature, time, voltage, leakage current, etc., during the test process, the threshold voltage VGETH and other parameters can be monitored according to the program setting requirements. The threshold voltage measurements meet the standards AQG324, JEP183A Gated-diode method, and refer to JEP184 measure circuit mode.

Technical Parameters


Voltage

Gate Bias Pressure ■ Static and dynamic voltage-35V~ +35V, program control;
■ Switch frequency DC~500kHz(20K@50nF,500K@2nF); Frequency step 0.1 kHz, Accuracy 2%RD+0.2 kHz; Resolution 0.1 KHz;
■ Duty cycle 0%~10o%; Frequency step1%; Accuracy 1%RD0.2%:Resolution1%;
■ dV/dt21V/nS(C≤2nF); dV/dt>5OmV/nS(C≤50nF); Overshoot<5%;
Temperature Scope Room temperature ~175°CC
Resolution:0.1°C; Accuracy: 2°C; Temperature uniformi-ty:≤3°C;Temperature stability:≤1°C
■ 176~225°C
Resolution:0.1°C; Accuracy: 2°C; Temperature uniformi-ty: ≤5°C;Temperature stability:≤3°C.


Measurements

Leakage current ■ 1nA~99.9nA, Accuracy1%RD土0.2nA, Resolution 0.1nA;
■ 100nA~999nA, 1%RD土2nA, Resolution 1nA;
■ 1uA~9.9uA, 1%RD土0.02uA, Resolution 0.01uA;
■ 10uA~99.9uA, 1%RD土0.2uA, Resolution 0.1uA.
VGSTH ■ Voltage range 0~10V, Resolution 10mV, Accuracy 1%RD士20mV.
■ IGE output 0~1A,0-100mA; Resolution 0.05mA; Accuracy 1%SET+0.1mA;100mA~1A; Resolution 0.5mA:Accuracy1%SET 1mA.
■ Bias voltage:-35V~+35V.
■ After the bias voltage is applied, the test is completed in 10 milliseconds
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